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Boeken
Scalable Infrastructure For Distributed Sensor Networks
Scalable Infrastructure for Information Processing in Distributed Sensor Networks »
Scalable Infrastructure for Information Processing in Distributed Sensor Networks »
Wafer-Level Testing and Test During Burn-In for Integrated Circuits
Wafer-Level Testing and Test During Burn-In for Integrated Circuits »
Wafer-Level Testing and Test During Burn-In for Integrated Circuits »
Thermal Management of Integrated Circuits
Chapter 1 from Adaptive Cooling of Integrated Circuites Using Digital Microfluidics »
Chapter 1 from Adaptive Cooling of Integrated Circuites Using Digital Microfluidics »
Appendices
Image Analysis Software Using MATLAB; Microfluidic Chip Design Reference; RTD Heater Top Plate Design Reference; Material Safety Sheet: Me »
Image Analysis Software Using MATLAB; Microfluidic Chip Design Reference; RTD Heater Top Plate Design Reference; Material Safety Sheet: Me »
Adaptive Hot-Spot Cooling Principles and Design
Chapter 3 from Adaptive Cooling of Integrated Circuites Using Digital Microfluidics »
Chapter 3 from Adaptive Cooling of Integrated Circuites Using Digital Microfluidics »
Concluding Remarks
Chapter 8 from Adaptive Cooling of Integrated Circuites Using Digital Microfluidics »
Chapter 8 from Adaptive Cooling of Integrated Circuites Using Digital Microfluidics »
Thermal Effects of Digital Microfluidic Devices
Chapter 5 from Adaptive Cooling of Integrated Circuites Using Digital Microfluidics »
Chapter 5 from Adaptive Cooling of Integrated Circuites Using Digital Microfluidics »
Technology Development
Chapter 4 from Adaptive Cooling of Integrated Circuites Using Digital Microfluidics »
Chapter 4 from Adaptive Cooling of Integrated Circuites Using Digital Microfluidics »
